Double Pulse MOSFET Tester

Project

The Double Pulse MOSFET tester is a system used to characterize losses in Silicon-Carbide (SiC) high-power MOSFET semiconductor devices.

• Improve characterization of SiCswitching losses
• Allow for better educated design decisions for power converters using these devices
• Perform automated sweeps of operating conditions across voltage, current, and temperature
• Objectives:
  • Test switching losses for SiCXM3 half bridge MOSFET modules
  • Improve understanding of losses in SiCMOSFETs
  • Allow for more informed decisions for power converters using these devices

System

Methods

• Utilized design of existing test fixture from Wolfspeed/Cree
• Designed inductor for system
• Use TI Launchpad microcontroller to time gate signals (TMS320F28069)
• Collect data with Tektronix 1 GS/s oscilloscope
• Current viewing resistor (2.5 mΩ) from T&M Research

Conclusion

• Tested losses of CAB400M12XM3 400A/1200V half-bridge module from Wolfspeed/Cree
• System works for characterizing losses of XM3 half-bridge modules
• Future development plan is to enable automated testing and control of device temperature
• Learned how to design air-core inductors with help from senior engineer at UPEL
• Will be able to help characterize losses for future projects at UPEL